See The Future
Princeton Instruments
Scientific Imaging Industrial Imaging Spectroscopy X-Ray Acton Optics
Search

Reflection Spectroscopy

Reflection coefficient
Normal and parallel incidence and Brewster’s angle
Total internal reflection (TIR)

Mirror and diffuse reflection

Recommended Products

Every time a light beam propagates from one medium with refraction index n1 into another with different refraction index n2 a media interface of a surface occurs which reflects light. A refraction index shows how much light propagation is slowing down in a medium as compared with the light speed in vacuum. Shorter wavelengths experience a more pronounced slowing in substances. Here are examples of refraction indices of fused silica (SiO2) for different wavelengths:

1. For UV monochromatic light at 220 nm refraction index n = 1.53;

2. For NIR monochromatic light at 3700 nm n = 1.40.

Consider a surface between two transparent dielectric materials, i.e., air with refraction index n1 ˜ 1 and fused silica. The incident light beam will undergo partial reflection and partial transmission (Fig. 1). The angle of reflection qr always equals the angle of incidence qi:

qr = qi,

while the angle of transmission qt (also called an "angle of refraction") can be calculated from Snell’s equation:

n1 sin(qi) = n2 sin(qt),

where qi is the angle of incidence; n1 and n2 are the refraction indices of the two media.



             Figure 1. Reflection and transmission of the incident light

Reflection coefficient

Light waves are transverse in nature, meaning they oscillate perpendicular to the direction of their propagation. Amplitude of light waves can be separated into two orthogonally polarized components – P-component parallel to the plane in which light propagates and S-component perpendicular to this plane ("S" derived from the German word "senkrecht," or "perpendicular").

Figure 1 represents these orthogonal components: IP, IS - for the incident light beam, RP, RS - for the reflected beam and TP, TS - for the transmitted beam. Conventionally S-components which are perpendicular to the plane of view are depicted as a circle with a dot inside. P and S polarized components of light wave are reflected in a different way; therefore, consider a set of two reflection coefficients RP and RS calculated by Fresnel’s equations derived by French physicist Augustin-Jean Fresnel:















The reflection coefficient at 45º polarization (scrambled light) can be found from the equation:



To get an idea of what reflection coefficients RP, RS and R45 might resemble,  we calculated them for the incidence angles from 0 to 90º (Fig. 2). All coefficients were calculated for the monochromatic NIR light beam with wavelength l = 3700 nm entering fused silica (n = 1.40) from the air (n = 1).

A portion of light reflected from a surface increases as the difference between the refraction indices Dn = n2 - n1 grows larger. For demonstration, we calculated the reflection coefficients for visible monochromatic light with the wavelength l = 400 nm entering sapphire (n = 1.785) from the air (n = 1). The portion of reflected light in this instance was higher since sapphire has a higher refraction index than fused silica.

















                              Figure 2.                                                       



         














                                 
Figure 3.




Normal and parallel incidence and Brewster’s angle

Reflection coefficients are measured at the incidence angles between 0º (normal incidence) and 90º (parallel to the surface). At normal incidence qi = qr = 0 reflection co-efficients of all polarizations are equal:



The above-mentioned case represents fused silica represents (n1 = 1; n2 = 1.40) RP = RS = R45 = 2.78 % at normal incidence conditions, while sapphire represents (n1 = 1; n2 = 1.785) RP = RS = R45 = 7.94 %.

For the parallel incidence (qi = 90º) all light is reflected regardless of refraction indices n1 and n2 and RP = RS = R45 = 100%.

Another Special Scenario

Let's say at a certain incidence angle the P-polarized component of a light wave is not reflected from the surface and the resulting light beam is getting strictly S-polarized. This angle is called Brewster’s angle, in memory of Scottish physicist David Brewster:



The above-mentioned case represents fused silica (n1 = 1; n2 = 1.40) Brewster’s angle qB = 54.46º (see Fig.2), while the sapphire represents (n1 = 1; n2 = 1.785) qB = 60.74º (see Fig.3).

Total internal reflection (TIR)

When light moves from the medium with a higher refraction index to the medium with a lower refraction index (n1 > n2), the above equations have no solution above a certain angle of incidence which known as the critical angle qCR. Above this angle all light is reflected back to the first medium and no transmission takes place. This effect underlies the principle of fiber optics design. The critical angle can be derived from the equation:



Again, we have calculated reflection coefficients RP, RS and R45 for the incidence angles from 0 to 90º for the monochromatic NIR light beam with wavelength l = 3700 nm entering air (n = 1) from the fused silica (n = 1.40). As you can see from Fig.4 all reflection co-efficients reach 100% at the critical angle qCR = 45.58º. All incidence angles higher than this will result in total internal reflection. Note that Brewster’s angle is still present in this situation and equals 35.54º.

For the visible monochromatic light with wavelength l = 400 nm entering sapphire (n = 1.785) from the air (n = 1) the critical angle qCR = 34.07º. Brewster’s angle qB = 29.26º.



















                            Figure 4.    







                                                  










                             Figure 5.


Mirror and diffuse reflection

In the real world almost every surface or media interface has structural irregularities. When the size of these irregularities is smaller than the light wavelength l, there is a mirror reflection also called a "specular reflection." When the mirror reflection occurs, the reflected beam follows the laws of optics described below:

- reflected beam lays in the same plane with incident beam and the normal to the surface;

- angle of reflection equals the angle of incidence;

- Fresnel’s equations for reflection coefficients are correct and so on.

Therefore, in practical terms, we will know exactly were to expect the maximum intensity of the reflected beam and what the intensity is going to be.

The diffuse reflection occurs when arbitrarily situated irregularities of the surface are larger than the light wavelength l. In this case each structural irregularity acts as an independent micro-surface. The multitude of such irregularities reflects light in all possible directions. Truly diffuse reflection is described by the Lambert’s law according to which the intensity of light from a diffusely reflecting surface is uniform in all directions. Objects following this law are called "Lambertians." A good example of a Lambertian is a matte piece of paper; however, most real-life objects exhibit both types of reflection.

Recommended Products:

Acton Series Monochromators & Spectrographs
-  Positrak™ grating stabilization offers simple calibration
-  Optimized coatings for higher throughput
-  Interchangeable grating turrets with a wide selection of gratings


PIXIS CCD Cameras
-  Lifetime vacuum guarantee for worry-free operation
-  Deep cooling without the need for liquid circulators
-  Up to 1000 spectra/sec data acquisition

SPEC-10 CCD Cameras
-  Exclusive dual amplifier design offers high SNR or high dynamic range
-  Superior low light sensitivity through deeper cooling

PI-MAX ICCD Cameras
-  5MHz digitization provides up to 15 frames per second
-  500ps gating for ultra fast time resolution
-  Exclusive UNIGEN photocathode for highest sensitivity from deep UV to NIR

OMA V InGaAs Array Cameras
-  Excellent NIR sensitivity for demanding spectroscopy applications
-  Electronic shutter allows intergration times down to 20 µsec
-  1MHz digitization provides up to 1800 spectra/sec